alternative method for the determination of refractive index
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Abstract
Certain characterizations of AlxGa1−xN epilayers require knowledge of the refractive index. Four theoretical models are reviewed, and a simple method to obtain the refractive index n of AlxGa1−xN is proposed. Values of the refractive index obtained at various wavelengths and Al concentrations are compared to the theoretical models, as well as to previously obtained experimental results. Acceptable agreement with both theoretical and experimental values are obtained.
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