Question

Atomic force microscopic studies of cadmium oxide thin films

Answer 1

The surface morphology of TiO 2-and ZrO 2-based thin films, deposited from aqueous  

solution at 70–80 C onto functionalized organic self-assembled monolayers (SAMs) on  

silicon has been examined using atomic force microscopy (AFM). The films have been  

previously shown to consist, respectively, of nanocrystalline TiO 2 (anatase) and of  

nanocrystalline tetragonal ZrO 2 with amorphous basic zirconium sulfate. The films exhibit  

characteristic surface roughnesses on two length scales.