Chemistry, asked by ritikajakhotiya1310, 10 months ago

Atomic force microscopy measurements on thin films

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Answered by Anonymous

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Explanation:

An atomic force microscope (AFM) is a magnifying observation tool capable of measuring 3D textures of a minuscule area. Unlike scanning electron microscopes, it can acquire height data in numeric values, which enable quantification of sample and data post-processing.

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