Question

Difference between scanning electron microscope and double beam uv-vis microscope

Answer 1

In simple words, SEM utilizes back scattered and secondary electrons to form the image of the sample. In contrast, TEM utilizes transmitted electrons to form the image of the sample.

Answer 2

Answer:

Ultraviolet–visible spectrophotometer. The instrument used in ultraviolet–visible spectroscopy is called a UV/Vis spectrophotometer. It measures the intensity of light passing through a sample, and compares it to the intensity of light before it passes through the sample.

A scanning electron microscope is a type of electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons.

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