Explain the working principle of Scanning Electron Microscope (SEM).
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scanning electron microscope(SEM) is a type of electron microscopethat produces images of a sample byscanning the surface with a focused beam of electrons. ... The electronbeam is scanned in a raster scanpattern, and the position of the beam is combined with the detected signal to produce an image.
scanning electron microscope(SEM) is a type of electron microscopethat produces images of a sample byscanning the surface with a focused beam of electrons. ... The electronbeam is scanned in a raster scanpattern, and the position of the beam is combined with the detected signal to produce an image.
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principle of Scanning Electron Microscope
Explanation:
When the primary electron (PE) beam strikes the surface of a specimen, electrons are backscattered (BSE) by the atoms on the surface of the specimen; orbital electrons are also ejected from heavy atoms and secondary electrons (SE) are produced, and characteristic X-rays are generated. • From the analysis of the BSE signals and their reflection on the fluorescent screen, the image of the object is constructed, and from the analysis of characteristic X-rays, the elemental composition of the surface is determined.
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