Question

: Non-contact mode of atomic force microscopy gives poor resolution Reason (R): The cantilever tip does not touch the sample

Answer 1

Explanation:

In non-contact atomic force microscopy mode, the tip of the cantilever does not contact the sample surface. ... The van der Waals forces, which are strongest from 1 nm to 10 nm above the surface, or any other long-range force that extends above the surface acts to decrease the resonance frequency of the cantilever...