how the intensity of secondary maxima varies in case of Fraunhofer diffraction pattern for single slit
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According to Huygen Fresnel, every point of the wavefront in the plane of the slit is a source of secondary wavelets. ... Theintensity at the point P1 is either minimum or maximum and depends upon the path difference between thesecondary waves originating from the corresponding points of the wavefront.
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Intensity of secondary maxima decreases on either sides
Constructive interference of secondary wavelets from all areas of the slit causes the central maxima. Wavelets from fewer and lesser regions of the slit cause constructive interference to form secondary maxima as n (order of spectrum) increases. As a result, the intensity decreases.
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