How to measure area of dielectric materials?
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Aim of this paper is to present microstrip methods for analysis of dielectric materials properties' in High Frequency (HF) area. These methods include software tool which provides design of microstrip ring resonator and T-resonators tuned on specific frequencies which are periodically repeated. In addition to that, software tool includes calculation part which can determine dielectric constant and Q factor from real measured data of fabricated microstrip resonators. This software tool is suitable for analyzing dielectric materials of substrate boards, where planar microstrip transmission line can be applied e.g. Printed Circuit Boards (PCB)/etching process, Low Temperature Co-fired Ceramic (LTCC)/thick film technology etc. Advantage of this method is analyzing material and conductor as unit, like real fabricated devices, with considered conductive loses not only dielectric material itself.
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