Question

in the case of scanning electron microscope electrons are reflected through

Answer 1

Scanning electron microscope electrons are reflected through:

Explanation:

• A scanning electron microscope that produces images of a sample by scanning the surface with a focused beam of electrons.
• Electrons interact with atoms in a sample, producing various signals are contain information about the surface topography and the composition of a sample.
• The electron beam is scanned in a raster scan pattern, and the beam position is combined with the detected signal intensity to produce an image.
• In a most common SEM mode, secondary electrons emitted by atoms excited by a electron beam are detected using the secondary electron detector (Everhart–Thornley detector).
• The number of secondary electrons that can be detected, and thus the intensity of the signal, depends, among other things, on the sample topography.
• Some SEMs can achieve resolution better than 1 nanometer.