Question

Limitations on width of a thin film

Answer 1

Answer:

The thickness of thin layers on flat substrates can be easily and rapidly determined using a sensitive stylus method. In order to evaluate the limitations of this method when applied to evaporated films of soft metals, experiments have been carried out using a standard diamond tip with a radius of 13 μm. Plastic deformations of the layers have been observed using a scanning electron microscope. Data are presented for Bi, Al, Cu and Au films.

Explanation:

Answer 2

Explanation:

In order to evaluate the limitations of this method when applied to evaporated films of soft metals, experiments have been carried out using a standard diamond tip with a radius of 13 μm. Plastic deformations of the layers have been observed using a scanning electron microscope. Data are presented for Bi, Al, Cu and Au films.

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