Xrays photoelectron spectroscopy construction and working and application
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ans = X-ray photoelectron spectroscopy (XPS) is a surface-sensitive quantitative spectroscopic technique that measures the elemental composition at the parts per thousand range, empirical formula, chemical state and electronic state of the elements that exist within a material. Put more simply, XPS is a useful measurement technique because it not only shows what elements are within a film but also what other elements they are bonded to. This means if you have a metal oxide and you want to know if the metal is in a +1 or +2 state, using XPS will allow you to find that ratio. However at most the instrument will only probe 20nm into a sample.
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References
[1] Siham Ouardi, Gerhard H. Fecher, Claudia Felser, ‘Bulk electronic structure studied by hard X-ray photoelectron spectroscopy of the valence band:
[2] László Kövér, ‘X-ray photoelectron spectroscopy using hard X-rays,’ Journal of Electron Spectroscopy
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