What is circuit test approach in digital system design?
Answers
Step-by-step explanation:
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The current trend in electronic systems design is to push as much functionality as possible into integrated circuits. Newer systems are generally much smaller and much faster than their predecessors, but they also have larger and more complex integrated circuits. These circuits are often called Application Specific Integrated Circuits (ASICs) because they are specific to their own systems. Over the past few years, the number of ASICs fabricated has greatly increased, and the size and complexity of those ASICs has also increased. In order for these chips to remain cost-effective, however, design time must remain fairly short, and this has proven to be a difficult problem.
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Answer:
Test Pattern Generation: Test pattern generation is the process of generating a (minimal) set of input patterns to stimulate the inputs of a circuit, such that detectable faults can be exercised (if present) [Pradhan, 1986; Abramovici, 1990].